Skip links
JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**

JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**

USD 21.49 USD
SKU: K5tJLZNC
GTIN: 9780262513357
Condition: Like New

Specifications

ISBN-100262513358
GenreCOMPUTERS
ISBN9780262513357
Publication NameJourney to Data Quality
PublisherMIT Press
Item Length8.9 in
Publication Year2009
TypeTextbook
FormatTrade Paperback
LanguageEnglish
Item Height0.5 in
Item Weight11 Oz
Item Width6.3 in
Number Of Pages240 Pages

You will find that this textbook uses bullet points to highlight key facts.

Related Items

🍪 This website uses cookies to improve your web experience.